{"product_id":"accelerated-stress-testing-handbook-h-anthony-chan-9780780360259","title":"Accelerated Stress Testing Handbook: Guide for Achieving Quality Products","description":"As we move closer to a genuinely global economy, the pressure to develop highly reliable products on ever-tighter schedules will increase. Part of a designer's \"toolbox\" for achieving product reliability in a compressed time frame should be a set of best practices for utilizing accelerated stress testing (AST). \u003cp\u003e\u003ci\u003eThe Accelerated Stress Testing Handbook\u003c\/i\u003e delineates a core set of AST practices as part of an overall methodology for enhancing hardware product reliability. The techniques presented will teach readers to identify design deficiencies and problems with component quality or manufacturing processes early in the product's life, and then to take corrective action as quickly as possible. A wide array of case studies gleaned from leading practitioners of AST supplement the theory and methodology, which will provide the reader with a more concrete idea of how AST truly enhances quality in a reduced time frame.\u003c\/p\u003e \u003cp\u003eImportant topics covered include: \u003c\/p\u003e \u003cul\u003e \u003cli\u003eTheoretical basis for AST\u003c\/li\u003e \u003cli\u003eGeneral AST best practices\u003c\/li\u003e \u003cli\u003eAST design and manufacturing processes\u003c\/li\u003e \u003cli\u003eAST equipment and techniques\u003c\/li\u003e \u003cli\u003eAST process safety qualification\u003c\/li\u003e \u003c\/ul\u003e In this handbook, AST cases studies demonstrate thermal, vibration, electrical, and liquid stress application; failure mode analysis; and corrective action techniques. Individuals who would be interested in this book include: reliability engineers and researchers, mechanical and electrical engineers, those involved with all facets of electronics and telecommunications product design and manufacturing, and people responsible for implementing quality and process improvement programs.\u003cbr\u003e\u003cbr\u003e\u003cb\u003eAuthor:\u003c\/b\u003e H. Anthony Chan\u003cbr\u003e\u003cb\u003eISBN-10:\u003c\/b\u003e 0780360257\u003cbr\u003e\u003cb\u003eISBN-13:\u003c\/b\u003e 9780780360259\u003cbr\u003e\u003cb\u003ePublisher:\u003c\/b\u003e Wiley-IEEE Press\u003cbr\u003e\u003cb\u003eLanguage:\u003c\/b\u003e English\u003cbr\u003e\u003cb\u003ePublished:\u003c\/b\u003e 05\/25\/2001\u003cbr\u003e\u003cb\u003ePages:\u003c\/b\u003e 372\u003cbr\u003e\u003cb\u003eFormat:\u003c\/b\u003e Hardcover\u003cbr\u003e\u003cb\u003eWeight:\u003c\/b\u003e 1.96lbs\u003cbr\u003e\u003cb\u003eSize:\u003c\/b\u003e 10.32h x 6.92w x 0.99d\u003cbr\u003e\u003cbr\u003e\u003cb\u003eReview Citation(s): \u003c\/b\u003e\u003cbr\u003e\u003ci\u003eScitech Book News\u003c\/i\u003e 09\/01\/2001 pg. 153","brand":"H. Anthony Chan","offers":[{"title":"Hardcover","offer_id":48013785989375,"sku":"9780780360259","price":245.95,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0662\/2982\/9887\/files\/img_9ddee09a-ffd2-4e03-9233-9c65b7855285.jpg?v=1767744757","url":"https:\/\/www.whiterainbookhouse.com\/products\/accelerated-stress-testing-handbook-h-anthony-chan-9780780360259","provider":"WR Book House","version":"1.0","type":"link"}