{"product_id":"analytical-transmission-electron-microscopy-jrgen-thomas-9789401779883","title":"Analytical Transmission Electron Microscopy: An Introduction for Operators","description":"\u003cp\u003e1. Why such an effort?.- The problem with the magnification.- The limitation of resolution.- Electron waves.- The role of magnification.- 2. What should we know about electron optics and the construction of an electron microscope.- The principle of multistage imaging.- Rotational-symmetric magnetic fields as electron lenses.- Lens aberrations.- Resolution limit considering the spherical aberration.- Electron gun.- \"Richtstrahlwert\" (brightness).- We construct an electron microscope.- Illumination system.- Imaging system.- Specimen stage.- Acquiring the images.- Vacuum system.- Miscellaneous.- We prepare electron-transparent samples.- What is the challenge?.- \"Classical\" methods.- Cutting, grinding, and ion milling.- Focused Ion Beam (\"FIB\") techniques.- 4. Let us start with practical microscopy.- What do we peripherally need?.- We put the specimen into the holder and insert it into the microscope.- We check the (alignment) state of the microscope.- Focussing the image - sharpness and contrast.- Contamination and sample damaging.- 5. Let us switch to electron diffraction.- Why diffraction reflexes?.- Crystal lattices and lattice planes.- Selected area and convergent beam electron diffraction.- What can we learn from selected area diffraction patterns?.- Radii in ring diagrams.- Rules for forbidden reflections.- Intensities of diffraction reflections.- Positions of diffraction reflections in point diagrams.- Indexing of diffraction reflections.- Kikuchi- and HOLZ-lines.- Amorphous samples.- 6. Why do we see any contrast in the images?.- Elastic scattering of electrons within the sample.- Mass thickness and diffraction contrast.- Brightfield and darkfield imaging.- Bending contours, dislocations, and semicoherent particles.- Thickness contours, stacking faults, and twins.- Moiré patterns.- Magnetic domains: Lorentz microscopy.- 7. We increase the magnification.- Imaging of atomic columns in crystals: Phase contrast.- Contrast transfer by the objective lens.- Wave-optical interpretation of the resolution limit.- Periodic distribution of brightness in pictures: Fourier analysis.- Mass thickness and phase contrast.- Contrast of amorphous samples.- Correction of astigmatism.- Measurement of the resolution limit.- Correction of spherical and chromatic aberration.- Interpretation of high resolution TEM images.- 8. Let us switch to scanning transmission electron microscopy.- What happens electron-optically?.- Resolution or: What is the smallest diameter of the electron probe?.- Contrast in the scanning transmission electron microscopic image.- Speciality: High angle annular darkfield detector (HAADF).- J. Thomas, T. Gemming: \"Analytical TEM - an Introduction for Operators\".- 9. Let us use the analytical possibilities.- Analytical signals by inelastic interaction.- Emission of X-rays.- Electron energy losses.- Energy dispersive spectroscopy of characteristic X-rays (\"EDXS\").- X-ray spectrometers and spectra.- Qualitative interpretation of X-ray spectra.- Quantifying X-ray spectra.- Line profiles and elemental mappings.- Electron energy loss spectroscopy (\"EELS\").- Electron energy spectrometer.- Low-loss und Core-loss regions of the spectra.- Qualitative elemental analysis.- Background and multiple scattering: Requirements to the sample.- Measurement of the specimen thickness.- Edge fine structure: Bonding analysis.- Quantifying energy loss spectra.- Energy filtered imaging.- Comparison between EDXS and EELS.- 10. Basics explained in more detail (with a bit more mathematics).- Diffraction at an edge (Huygens' principle).- Wave function for electrons.- Electron wavelength relativistically calculated.- Electron beam paths in rotational-symmetric magnetic fields.- Resolution limit considering spherical aberration.- Schottky effect.- Electrical potential in rotational-symmetric arrangements of electrodes.- Laue equations and reciprocal lattice, Ewald construction.- Kinematical model: Lattice factor and structure factor.- Debye scattering\u003cbr\u003e\u003cbr\u003e\u003cb\u003eAuthor:\u003c\/b\u003e Jürgen Thomas, Thomas Gemming\u003cbr\u003e\u003cb\u003eISBN-10:\u003c\/b\u003e 9401779880\u003cbr\u003e\u003cb\u003eISBN-13:\u003c\/b\u003e 9789401779883\u003cbr\u003e\u003cb\u003ePublisher:\u003c\/b\u003e Springer\u003cbr\u003e\u003cb\u003eLanguage:\u003c\/b\u003e English\u003cbr\u003e\u003cb\u003ePublished:\u003c\/b\u003e 08\/23\/2016\u003cbr\u003e\u003cb\u003ePages:\u003c\/b\u003e 348\u003cbr\u003e\u003cb\u003eFormat:\u003c\/b\u003e Paperback\u003cbr\u003e\u003cb\u003eWeight:\u003c\/b\u003e 1.13lbs\u003cbr\u003e\u003cb\u003eSize:\u003c\/b\u003e 9.21h x 6.14w x 0.76d\u003c\/p\u003e","brand":"Jürgen Thomas","offers":[{"title":"Paperback","offer_id":44716487868671,"sku":"9789401779883","price":54.99,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0662\/2982\/9887\/files\/img_d5435d35-5e5f-4abf-a10d-0d33092de716.jpg?v=1705682559","url":"https:\/\/www.whiterainbookhouse.com\/products\/analytical-transmission-electron-microscopy-jrgen-thomas-9789401779883","provider":"WR Book House","version":"1.0","type":"link"}