{"product_id":"atomic-force-microscopy-greg-haugstad-9780470638828","title":"Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications","description":"This book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal\/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions.\u003cbr\u003e \u003cbr\u003e \u003cp\u003e\"Supplementary material for this book can be found by entering ISBN 9780470638828 on booksupport.wiley.com\"\u003c\/p\u003e\u003cbr\u003e\u003cbr\u003e\u003cb\u003eAuthor:\u003c\/b\u003e Greg Haugstad\u003cbr\u003e\u003cb\u003eISBN-10:\u003c\/b\u003e 0470638826\u003cbr\u003e\u003cb\u003eISBN-13:\u003c\/b\u003e 9780470638828\u003cbr\u003e\u003cb\u003ePublisher:\u003c\/b\u003e Wiley\u003cbr\u003e\u003cb\u003eLanguage:\u003c\/b\u003e English\u003cbr\u003e\u003cb\u003ePublished:\u003c\/b\u003e 09\/24\/2012\u003cbr\u003e\u003cb\u003ePages:\u003c\/b\u003e 496\u003cbr\u003e\u003cb\u003eFormat:\u003c\/b\u003e Hardcover\u003cbr\u003e\u003cb\u003eWeight:\u003c\/b\u003e 1.75lbs\u003cbr\u003e\u003cb\u003eSize:\u003c\/b\u003e 9.30h x 6.20w x 1.20d","brand":"Greg Haugstad","offers":[{"title":"Hardcover","offer_id":43919862006015,"sku":"9780470638828","price":169.95,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0662\/2982\/9887\/products\/img_6f1760f2-e5a0-43b3-b5b9-79af048a6225.jpg?v=1680812316","url":"https:\/\/www.whiterainbookhouse.com\/products\/atomic-force-microscopy-greg-haugstad-9780470638828","provider":"WR Book House","version":"1.0","type":"link"}