{"product_id":"electromigration-linghong-li-9783639088137","title":"Electromigration","description":"Electromigration is a microscopic phenomenon involving electric field-induced diffusion, which is very relevant to damage in interconnections. A common method for monitoring interconnection degradation is through electrical resistance measurements, which requires direct electrical contact. It is desirable to develop non-contact methods to monitor electromigration damage formation. In this thesis, we propose a novel Optical Microscopy Imaging Method (OMIM), and we provide a theoretical description and experimental results. OMIM not only pro-vides a new method for studying electromigration, but also provides a useful method for studying other micro-devices and materials in a non-contact mode.\u003cbr\u003e\u003cbr\u003e\u003cb\u003eAuthor:\u003c\/b\u003e Linghong Li\u003cbr\u003e\u003cb\u003eISBN-10:\u003c\/b\u003e 3639088131\u003cbr\u003e\u003cb\u003eISBN-13:\u003c\/b\u003e 9783639088137\u003cbr\u003e\u003cb\u003ePublisher:\u003c\/b\u003e VDM Verlag Dr. Mueller E.K.\u003cbr\u003e\u003cb\u003eLanguage:\u003c\/b\u003e English\u003cbr\u003e\u003cb\u003ePublished:\u003c\/b\u003e 10\/10\/2008\u003cbr\u003e\u003cb\u003ePages:\u003c\/b\u003e 76\u003cbr\u003e\u003cb\u003eFormat:\u003c\/b\u003e Paperback\u003cbr\u003e\u003cb\u003eWeight:\u003c\/b\u003e 0.25lbs\u003cbr\u003e\u003cb\u003eSize:\u003c\/b\u003e 9.00h x 6.00w x 0.16d","brand":"Linghong Li","offers":[{"title":"Paperback","offer_id":48454048088319,"sku":"9783639088137","price":52.92,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0662\/2982\/9887\/files\/img_ea884450-d8cb-44e6-aed0-cf3b85d9c452.jpg?v=1777303870","url":"https:\/\/www.whiterainbookhouse.com\/products\/electromigration-linghong-li-9783639088137","provider":"WR Book House","version":"1.0","type":"link"}