{"product_id":"high-resolution-x-ray-diffractometry-and-d-k-bowen-9780367400637","title":"High Resolution X-Ray Diffractometry And Topography","description":"The rapid growth in the applications of electronic materials has created an increasing demand for reliable techniques for examining and characterizing these materials. This book explores the area of x-ray diffraction and the techniques available for deployment in research, development, and production. It maps the theoretical and practical background necessary to study single crystal materials using high resolution x-ray diffraction and topography. It combines mathematical formalism with graphical explanations and hands-on advice for interpreting data, thus providing the theoretical and practical background for applying these techniques in scientific and industrial materials characterization.\u003cbr\u003e\u003cbr\u003e\u003cb\u003eAuthor:\u003c\/b\u003e D. K. Bowen, Brian K. Tanner\u003cbr\u003e\u003cb\u003eISBN-10:\u003c\/b\u003e 0367400634\u003cbr\u003e\u003cb\u003eISBN-13:\u003c\/b\u003e 9780367400637\u003cbr\u003e\u003cb\u003ePublisher:\u003c\/b\u003e CRC Press\u003cbr\u003e\u003cb\u003eLanguage:\u003c\/b\u003e English\u003cbr\u003e\u003cb\u003ePublished:\u003c\/b\u003e 10\/10\/2019\u003cbr\u003e\u003cb\u003ePages:\u003c\/b\u003e 264\u003cbr\u003e\u003cb\u003eFormat:\u003c\/b\u003e Paperback\u003cbr\u003e\u003cb\u003eWeight:\u003c\/b\u003e 0.95lbs\u003cbr\u003e\u003cb\u003eSize:\u003c\/b\u003e 9.50h x 6.80w x 0.70d","brand":"D. K. Bowen","offers":[{"title":"Paperback","offer_id":45064672444671,"sku":"9780367400637","price":82.99,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0662\/2982\/9887\/files\/img_235fa48b-d4fb-47af-b39b-d037edbcb5dc.jpg?v=1712124788","url":"https:\/\/www.whiterainbookhouse.com\/products\/high-resolution-x-ray-diffractometry-and-d-k-bowen-9780367400637","provider":"WR Book House","version":"1.0","type":"link"}