{"product_id":"infrared-ellipsometry-on-semiconductor-layer-mathias-schubert-9783540232490","title":"Infrared Ellipsometry on Semiconductor Layer Structures: Phonons, Plasmons, and Polaritons","description":"\u003cp\u003eThe study of semiconductor-layer structures using infrared ellipsometry is a rapidly growing field within optical spectroscopy. This book offers basic insights into the concepts of phonons, plasmons and polaritons, and the infrared dielectric function of semiconductors in layered structures. It describes how strain, composition, and the state of the atomic order within complex layer structures of multinary alloys can be determined from an infrared ellipsometry examination. Special emphasis is given to free-charge-carrier properties, and magneto-optical effects. \u003c\/p\u003e \u003cp\u003eA broad range of experimental examples are described, including multinary alloys of zincblende and wurtzite structure semiconductor materials, and future applications such as organic layer structures and highly correlated electron systems are proposed.\u003c\/p\u003e\u003cbr\u003e\u003cbr\u003e\u003cb\u003eAuthor:\u003c\/b\u003e Mathias Schubert\u003cbr\u003e\u003cb\u003eISBN-10:\u003c\/b\u003e 3540232494\u003cbr\u003e\u003cb\u003eISBN-13:\u003c\/b\u003e 9783540232490\u003cbr\u003e\u003cb\u003ePublisher:\u003c\/b\u003e Springer\u003cbr\u003e\u003cb\u003eLanguage:\u003c\/b\u003e English\u003cbr\u003e\u003cb\u003ePublished:\u003c\/b\u003e 11\/26\/2004\u003cbr\u003e\u003cb\u003ePages:\u003c\/b\u003e 196\u003cbr\u003e\u003cb\u003eFormat:\u003c\/b\u003e Hardcover\u003cbr\u003e\u003cb\u003eWeight:\u003c\/b\u003e 1.05lbs\u003cbr\u003e\u003cb\u003eSize:\u003c\/b\u003e 9.21h x 6.14w x 0.50d","brand":"Mathias Schubert","offers":[{"title":"Hardcover","offer_id":44073632399615,"sku":"9783540232490","price":249.99,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0662\/2982\/9887\/files\/img_a6b5dd37-78d1-4ae9-9fe2-61222b16635b.jpg?v=1685448975","url":"https:\/\/www.whiterainbookhouse.com\/products\/infrared-ellipsometry-on-semiconductor-layer-mathias-schubert-9783540232490","provider":"WR Book House","version":"1.0","type":"link"}