{"product_id":"ionizing-radiation-effects-in-mos-t-p-ma-9780471848936","title":"Ionizing Radiation Effects in Mos Devices and Circuits","description":"This is the first comprehensive overview describing the effects of ionizing radiation on MOS devices, and how to design, fabricate, and test integrated circuits intended for use in a radiation environment. It also addresses process-induced radiation effects in the fabrication of high-density circuits, and reviews the history of radiation-hard technology, providing background information for those new to the field. The book includes a comprehensive review of the literature, and an annotated listing of research activities in radiation-hardness research. The volume will be of benefit to semi conductor process development engineers, device and circuit development engineers, device physicists, reliability assurance engineers, project managers and stress analysts.\u003cbr\u003e\u003cbr\u003e\u003cb\u003eAuthor:\u003c\/b\u003e T. P. Ma\u003cbr\u003e\u003cb\u003eISBN-10:\u003c\/b\u003e 047184893X\u003cbr\u003e\u003cb\u003eISBN-13:\u003c\/b\u003e 9780471848936\u003cbr\u003e\u003cb\u003ePublisher:\u003c\/b\u003e Wiley-Interscience\u003cbr\u003e\u003cb\u003eLanguage:\u003c\/b\u003e English\u003cbr\u003e\u003cb\u003ePublished:\u003c\/b\u003e 04\/18\/1989\u003cbr\u003e\u003cb\u003ePages:\u003c\/b\u003e 608\u003cbr\u003e\u003cb\u003eFormat:\u003c\/b\u003e Hardcover\u003cbr\u003e\u003cb\u003eWeight:\u003c\/b\u003e 2.09lbs\u003cbr\u003e\u003cb\u003eSize:\u003c\/b\u003e 9.62h x 6.58w x 1.35d","brand":"T. P. Ma","offers":[{"title":"Hardcover","offer_id":44119747264767,"sku":"9780471848936","price":372.95,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0662\/2982\/9887\/files\/img_41b14867-06ae-4901-a104-f494c002247b.jpg?v=1687410741","url":"https:\/\/www.whiterainbookhouse.com\/products\/ionizing-radiation-effects-in-mos-t-p-ma-9780471848936","provider":"WR Book House","version":"1.0","type":"link"}