{"product_id":"leakage-current-and-defect-characterization-guntrade-roll-9783832532611","title":"Leakage Current and Defect Characterization of Short Channel Mosfets","description":"The continuous improvement in semiconductor technology requires field effect transistor scaling while maintaining acceptable leakage currents. This study analyzes the effect of scaling on the leakage current and defect distribution in peripheral DRAM transistors. The influence of important process changes, such as the high-k gate patterning and encapsulation as well as carbon co-implants in the source\/drain junction are investigated by advanced electrical measurements and TCAD simulation. A complete model for the trap assisted leakage currents in the silicon bulk of the transistors is presented.\u003cbr\u003e\u003cbr\u003e\u003cb\u003eAuthor:\u003c\/b\u003e Guntrade Roll\u003cbr\u003e\u003cb\u003eISBN-10:\u003c\/b\u003e 3832532617\u003cbr\u003e\u003cb\u003eISBN-13:\u003c\/b\u003e 9783832532611\u003cbr\u003e\u003cb\u003ePublisher:\u003c\/b\u003e Logos Verlag Berlin\u003cbr\u003e\u003cb\u003eLanguage:\u003c\/b\u003e English\u003cbr\u003e\u003cb\u003ePublished:\u003c\/b\u003e 11\/30\/2012\u003cbr\u003e\u003cb\u003ePages:\u003c\/b\u003e 235\u003cbr\u003e\u003cb\u003eFormat:\u003c\/b\u003e Paperback","brand":"Guntrade Roll","offers":[{"title":"Paperback","offer_id":48450127397119,"sku":"9783832532611","price":75.0,"currency_code":"USD","in_stock":false}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0662\/2982\/9887\/files\/img_55165839-43ca-4076-9ae5-fce31a01033f.jpg?v=1777266329","url":"https:\/\/www.whiterainbookhouse.com\/products\/leakage-current-and-defect-characterization-guntrade-roll-9783832532611","provider":"WR Book House","version":"1.0","type":"link"}