{"product_id":"metal-impurities-in-silicon-and-cor-claeys-9783319939247","title":"Metal Impurities in Silicon- And Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact","description":"This book provides a unique review of various aspects of metallic contamination in Si and Ge-based semiconductors. It discusses all of the important metals including their origin during crystal and\/or device manufacturing, their fundamental properties, their characterization techniques and their impact on electrical devices' performance. Several control and possible gettering approaches are addressed. The book offers a valuable reference guide for all researchers and engineers studying advanced and state-of-the-art micro- and nano-electronic semiconductor devices and circuits. Adopting an interdisciplinary approach, it combines perspectives from e.g. material science, defect engineering, device processing, defect and device characterization, and device physics and engineering.\u003cp\u003e\u003c\/p\u003e\u003cbr\u003e\u003cbr\u003e\u003cb\u003eAuthor:\u003c\/b\u003e Cor Claeys,Eddy Simoen\u003cbr\u003e\u003cb\u003eISBN-10:\u003c\/b\u003e 3319939246\u003cbr\u003e\u003cb\u003eISBN-13:\u003c\/b\u003e 9783319939247\u003cbr\u003e\u003cb\u003ePublisher:\u003c\/b\u003e Springer\u003cbr\u003e\u003cb\u003eLanguage:\u003c\/b\u003e English\u003cbr\u003e\u003cb\u003ePublished:\u003c\/b\u003e 08\/22\/2018\u003cbr\u003e\u003cb\u003ePages:\u003c\/b\u003e 438\u003cbr\u003e\u003cb\u003eFormat:\u003c\/b\u003e Hardcover\u003cbr\u003e\u003cb\u003eWeight:\u003c\/b\u003e 1.84lbs\u003cbr\u003e\u003cb\u003eSize:\u003c\/b\u003e 9.21h x 6.14w x 1.06d","brand":"Cor Claeys","offers":[{"title":"Hardcover","offer_id":48800772260095,"sku":"9783319939247","price":199.99,"currency_code":"USD","in_stock":true}],"url":"https:\/\/www.whiterainbookhouse.com\/products\/metal-impurities-in-silicon-and-cor-claeys-9783319939247","provider":"WR Book House","version":"1.0","type":"link"}