{"product_id":"radiation-effects-and-soft-errors-ronald-d-schrimpf-9789812389404","title":"Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices","description":"This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.\u003cbr\u003e\u003cbr\u003e\u003cb\u003eAuthor:\u003c\/b\u003e Ronald D. Schrimpf\u003cbr\u003e\u003cb\u003eISBN-10:\u003c\/b\u003e 9812389407\u003cbr\u003e\u003cb\u003eISBN-13:\u003c\/b\u003e 9789812389404\u003cbr\u003e\u003cb\u003ePublisher:\u003c\/b\u003e World Scientific Publishing Company\u003cbr\u003e\u003cb\u003eLanguage:\u003c\/b\u003e English\u003cbr\u003e\u003cb\u003ePublished:\u003c\/b\u003e 08\/03\/2004\u003cbr\u003e\u003cb\u003ePages:\u003c\/b\u003e 348\u003cbr\u003e\u003cb\u003eFormat:\u003c\/b\u003e Hardcover\u003cbr\u003e\u003cb\u003eWeight:\u003c\/b\u003e 1.50lbs\u003cbr\u003e\u003cb\u003eSize:\u003c\/b\u003e 9.80h x 6.60w x 0.90d","brand":"Ronald D. Schrimpf","offers":[{"title":"Hardcover","offer_id":44598750642431,"sku":"9789812389404","price":162.0,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0662\/2982\/9887\/files\/img_e3ab488a-e10b-4ae0-baec-7619463bc900.jpg?v=1702384223","url":"https:\/\/www.whiterainbookhouse.com\/products\/radiation-effects-and-soft-errors-ronald-d-schrimpf-9789812389404","provider":"WR Book House","version":"1.0","type":"link"}