{"product_id":"random-non-random-periodic-fau-m-t-sebastian-9782881249259","title":"Random Non-Random Periodic Fau","description":"This book provides a comprehensive overview of stacking faults in crystal structures. Subjects covered include: notations used in representations of close-packed structures; types of faults; methods of detection and measurement such as X-ray diffraction, electron diffraction and other techniques; theoretical models of non-random faulting during phase transitions; specific examples of - close packed structures including, zinc sulphide, silicon carbide and silver iodide.\u003cbr\u003e\u003cbr\u003e\u003cb\u003eAuthor:\u003c\/b\u003e M. T. Sebastian,P. Krishna\u003cbr\u003e\u003cb\u003eISBN-10:\u003c\/b\u003e 2881249256\u003cbr\u003e\u003cb\u003eISBN-13:\u003c\/b\u003e 9782881249259\u003cbr\u003e\u003cb\u003ePublisher:\u003c\/b\u003e Routledge\u003cbr\u003e\u003cb\u003eLanguage:\u003c\/b\u003e English\u003cbr\u003e\u003cb\u003ePublished:\u003c\/b\u003e 03\/31\/1994\u003cbr\u003e\u003cb\u003ePages:\u003c\/b\u003e 400\u003cbr\u003e\u003cb\u003eFormat:\u003c\/b\u003e Hardcover","brand":"M. T. Sebastian","offers":[{"title":"Hardcover","offer_id":48066341110015,"sku":"9782881249259","price":150.0,"currency_code":"USD","in_stock":false}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0662\/2982\/9887\/files\/img_041301d6-f19f-4b51-85a3-669db56a7d74.jpg?v=1768678131","url":"https:\/\/www.whiterainbookhouse.com\/products\/random-non-random-periodic-fau-m-t-sebastian-9782881249259","provider":"WR Book House","version":"1.0","type":"link"}