{"product_id":"reliability-physics-and-engineering-j-w-mcpherson-9783319936826","title":"Reliability Physics and Engineering: Time-To-Failure Modeling","description":"\u003cp\u003eProvides comprehensive textbook on reliability physics of semiconductors, from fundamentals to applications\u003c\/p\u003e \u003cp\u003eExplains the fundamentals of reliability physics and engineering tools for building better products\u003c\/p\u003e \u003cp\u003eContains statistical training and tools within the text\u003c\/p\u003e \u003cp\u003eIncludes new chapters on Physics of Degradation, and Resonance and Resonance-Induced Degradation.\u003c\/p\u003e\u003cbr\u003e\u003cbr\u003e\u003cb\u003eAuthor:\u003c\/b\u003e J. W. McPherson\u003cbr\u003e\u003cb\u003eISBN-10:\u003c\/b\u003e 3319936824\u003cbr\u003e\u003cb\u003eISBN-13:\u003c\/b\u003e 9783319936826\u003cbr\u003e\u003cb\u003ePublisher:\u003c\/b\u003e Springer\u003cbr\u003e\u003cb\u003eLanguage:\u003c\/b\u003e English\u003cbr\u003e\u003cb\u003ePublished:\u003c\/b\u003e 01\/10\/2019\u003cbr\u003e\u003cb\u003ePages:\u003c\/b\u003e 463\u003cbr\u003e\u003cb\u003eFormat:\u003c\/b\u003e Hardcover\u003cbr\u003e\u003cb\u003eWeight:\u003c\/b\u003e 1.87lbs\u003cbr\u003e\u003cb\u003eSize:\u003c\/b\u003e 9.21h x 6.14w x 1.06d","brand":"J. W. McPherson","offers":[{"title":"Hardcover","offer_id":43940788928767,"sku":"9783319936826","price":119.99,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0662\/2982\/9887\/products\/img_20b95672-d35d-4f89-b2c7-d71d4ce5c462.jpg?v=1681449187","url":"https:\/\/www.whiterainbookhouse.com\/products\/reliability-physics-and-engineering-j-w-mcpherson-9783319936826","provider":"WR Book House","version":"1.0","type":"link"}