{"product_id":"secondary-ion-mass-spectrometry-fred-stevie-9781606505885","title":"Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization","description":"This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained. It also will serve as a reference for those who need to provide SIMS data. The book has over 200 figures and the references allow one to trace development of SIMS and understand the many details of the technique.\u003cbr\u003e\u003cbr\u003e\u003cb\u003eAuthor:\u003c\/b\u003e Fred Stevie\u003cbr\u003e\u003cb\u003eISBN-10:\u003c\/b\u003e 1606505882\u003cbr\u003e\u003cb\u003eISBN-13:\u003c\/b\u003e 9781606505885\u003cbr\u003e\u003cb\u003ePublisher:\u003c\/b\u003e Momentum Press\u003cbr\u003e\u003cb\u003eLanguage:\u003c\/b\u003e English\u003cbr\u003e\u003cb\u003ePublished:\u003c\/b\u003e 09\/15\/2015\u003cbr\u003e\u003cb\u003ePages:\u003c\/b\u003e 277\u003cbr\u003e\u003cb\u003eFormat:\u003c\/b\u003e Paperback\u003cbr\u003e\u003cb\u003eWeight:\u003c\/b\u003e 0.86lbs\u003cbr\u003e\u003cb\u003eSize:\u003c\/b\u003e 9.00h x 6.00w x 0.61d","brand":"Fred Stevie","offers":[{"title":"Paperback","offer_id":43987933888767,"sku":"9781606505885","price":79.95,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0662\/2982\/9887\/files\/img_b8e77572-59ba-47fc-a6ab-128ceb4cdcba.jpg?v=1683291677","url":"https:\/\/www.whiterainbookhouse.com\/products\/secondary-ion-mass-spectrometry-fred-stevie-9781606505885","provider":"WR Book House","version":"1.0","type":"link"}