{"product_id":"semiconductor-laser-engineering-reliability-and-peter-w-epperlein-9781119990338","title":"Semiconductor Laser Engineering, Reliability and Diagnostics: A Practical Approach to High Power and Single Mode Devices","description":"\u003cp\u003eThis reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature.\u003c\/p\u003e \u003cp\u003eDiode laser fundamentals are discussed, followed by an elaborate discussion of problem-oriented design guidelines and techniques, and by a systematic treatment of the origins of laser degradation and a thorough exploration of the engineering means to enhance the optical strength of the laser. Stability criteria of critical laser characteristics and key laser robustness factors are discussed along with clear design considerations in the context of reliability engineering approaches and models, and typical programs for reliability tests and laser product qualifications. Novel, advanced diagnostic methods are reviewed to discuss, for the first time in detail in book literature, performance- and reliability-impacting factors such as temperature, stress and material instabilities.\u003c\/p\u003e \u003cp\u003e\u003cb\u003eFurther key features include: \u003c\/b\u003e\u003c\/p\u003e \u003cul\u003e \u003cli\u003epractical design guidelines that consider also reliability related effects, key laser robustness factors, basic laser fabrication and packaging issues;\u003c\/li\u003e \u003cli\u003edetailed discussion of diagnostic investigations of diode lasers, the fundamentals of the applied approaches and techniques, many of them pioneered by the author to be fit-for-purpose and novel in the application;\u003c\/li\u003e \u003cli\u003esystematic insight into laser degradation modes such as catastrophic optical damage, and a wide range of technologies to increase the optical strength of diode lasers;\u003c\/li\u003e \u003cli\u003ecoverage of basic concepts and techniques of laser reliability engineering with details on a standard commercial high power laser reliability test program.\u003c\/li\u003e \u003c\/ul\u003e \u003cp\u003e\u003ci\u003eSemiconductor Laser Engineering, Reliability and Diagnostics\u003c\/i\u003e reflects the extensive expertise of the author in the diode laser field both as a top scientific researcher as well as a key developer of high-power highly reliable devices. With invaluable practical advice, this new reference book is suited to practising researchers in diode laser technologies, and to postgraduate engineering students.\u003c\/p\u003e\u003cbr\u003e\u003cbr\u003e\u003cb\u003eAuthor:\u003c\/b\u003e Peter W. Epperlein\u003cbr\u003e\u003cb\u003eISBN-10:\u003c\/b\u003e 1119990335\u003cbr\u003e\u003cb\u003eISBN-13:\u003c\/b\u003e 9781119990338\u003cbr\u003e\u003cb\u003ePublisher:\u003c\/b\u003e Wiley\u003cbr\u003e\u003cb\u003eLanguage:\u003c\/b\u003e English\u003cbr\u003e\u003cb\u003ePublished:\u003c\/b\u003e 03\/18\/2013\u003cbr\u003e\u003cb\u003ePages:\u003c\/b\u003e 520\u003cbr\u003e\u003cb\u003eFormat:\u003c\/b\u003e Hardcover\u003cbr\u003e\u003cb\u003eWeight:\u003c\/b\u003e 1.70lbs\u003cbr\u003e\u003cb\u003eSize:\u003c\/b\u003e 9.10h x 6.20w x 1.20d","brand":"Peter W. Epperlein","offers":[{"title":"Hardcover","offer_id":44057373835519,"sku":"9781119990338","price":151.95,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0662\/2982\/9887\/files\/img_3e808c67-144c-431c-bc18-4ee458110bad.jpg?v=1685046600","url":"https:\/\/www.whiterainbookhouse.com\/products\/semiconductor-laser-engineering-reliability-and-peter-w-epperlein-9781119990338","provider":"WR Book House","version":"1.0","type":"link"}