{"product_id":"surface-and-interface-analysis-seong-h-kim-9781394218349","title":"Surface and Interface Analysis: Principles and Applications","description":"\u003cp\u003e\u003cb\u003eComprehensive textbook covering characterization techniques to understand the chemistry and structure of materials on surfaces and at interfaces\u003c\/b\u003e \u003c\/p\u003e\u003cp\u003e\u003ci\u003eSurface and Interface Analysis\u003c\/i\u003e is a comprehensive textbook resource that covers everything readers need to know about surface energy, molecular speciation, and optical and physical characterization techniques. Assuming only basic knowledge of general chemistry (electronic orbitals, organic functional groups), physics (electromagnetic waves, Maxwell equations), physical chemistry (Schr?dinger equation, harmonic oscillator), and mathematics (wave equations, covariance matrix), this textbook helps readers understand the underlying principles of the discussed characterization techniques and enables them to translate theoretical knowledge into applied skills through a Maieutic pedagogical approach. \u003c\/p\u003e\u003cp\u003eWritten by a highly qualified professor, \u003ci\u003eSurface and Interface Analysis: Fundamental Principles\u003c\/i\u003e includes information on: \u003c\/p\u003e\u003cul\u003e \u003cli\u003eRelationship between surface energy and the Gibbs free energy equation and surface characterization techniques that work in an ultra-high vacuum\u003c\/li\u003e \u003cli\u003eMeasurement of binding energy of photoelectrons and relaxation processes that can occur upon or during the photoelectron emission process\u003c\/li\u003e \u003cli\u003eGovernance of energy level of the valence band and what can be learned from analyzing the valence band with XPS\u003c\/li\u003e \u003cli\u003eImprovement of depth resolution in sputter profiling and artifacts that may be encountered during sputter depth profiling\u003c\/li\u003e \u003c\/ul\u003e \u003cp\u003e\u003ci\u003eSurface and Interface Analysis\u003c\/i\u003e is an ideal textbook resource on the subject for graduate students in the fields of solid state physics, optics, materials science, chemistry, and engineering who want to learn and apply advanced materials characterization methods, along with undergraduate students in advanced elective courses.\u003cbr\u003e\u003cbr\u003e\u003cb\u003eAuthor:\u003c\/b\u003e Seong H. Kim\u003cbr\u003e\u003cb\u003eISBN-10:\u003c\/b\u003e 1394218346\u003cbr\u003e\u003cb\u003eISBN-13:\u003c\/b\u003e 9781394218349\u003cbr\u003e\u003cb\u003ePublisher:\u003c\/b\u003e Wiley\u003cbr\u003e\u003cb\u003eLanguage:\u003c\/b\u003e English\u003cbr\u003e\u003cb\u003ePublished:\u003c\/b\u003e 01\/09\/2025\u003cbr\u003e\u003cb\u003ePages:\u003c\/b\u003e 416\u003cbr\u003e\u003cb\u003eFormat:\u003c\/b\u003e Paperback\u003c\/p\u003e","brand":"Seong H. Kim","offers":[{"title":"Paperback","offer_id":46618081034495,"sku":"9781394218349","price":129.25,"currency_code":"USD","in_stock":true}],"thumbnail_url":"\/\/cdn.shopify.com\/s\/files\/1\/0662\/2982\/9887\/files\/img_0a0ebaf6-eebc-49e4-9fdb-1f263033ab12.jpg?v=1740069113","url":"https:\/\/www.whiterainbookhouse.com\/products\/surface-and-interface-analysis-seong-h-kim-9781394218349","provider":"WR Book House","version":"1.0","type":"link"}