{"product_id":"system-on-chip-test-architectures-laung-terng-wang-9780123739735","title":"System-On-Chip Test Architectures: Nanometer Design for Testability Volume .","description":"Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog\/mixed-signal designs.\u003cbr\u003e\u003cbr\u003e\u003cb\u003eAuthor:\u003c\/b\u003e Laung-Terng Wang,Charles E. Stroud,Nur A. Touba\u003cbr\u003e\u003cb\u003eISBN-10:\u003c\/b\u003e 012373973X\u003cbr\u003e\u003cb\u003eISBN-13:\u003c\/b\u003e 9780123739735\u003cbr\u003e\u003cb\u003ePublisher:\u003c\/b\u003e Morgan Kaufmann Publishers\u003cbr\u003e\u003cb\u003eLanguage:\u003c\/b\u003e English\u003cbr\u003e\u003cb\u003ePublished:\u003c\/b\u003e 11\/01\/2007\u003cbr\u003e\u003cb\u003ePages:\u003c\/b\u003e 896\u003cbr\u003e\u003cb\u003eFormat:\u003c\/b\u003e Hardcover\u003cbr\u003e\u003cb\u003eWeight:\u003c\/b\u003e 3.48lbs\u003cbr\u003e\u003cb\u003eSize:\u003c\/b\u003e 9.25h x 7.66w x 1.60d","brand":"Laung-Terng Wang","offers":[{"title":"Hardcover","offer_id":48991603196159,"sku":"9780123739735","price":84.95,"currency_code":"USD","in_stock":false}],"url":"https:\/\/www.whiterainbookhouse.com\/products\/system-on-chip-test-architectures-laung-terng-wang-9780123739735","provider":"WR Book House","version":"1.0","type":"link"}