Aberration-Corrected Analytical Transmission Electron Microscopy by Brydson, Rik

Aberration-Corrected Analytical Transmission Electron Microscopy (Hardcover) (ISBN-13: 9780470518519)

Vendor: Rik Brydson
Product type: Books
Format: Hardcover
$70.95
$70.95
$70.95
Subtotal: $70.95
Aberration-Corrected Analytical Transmission Electron Microscopy by Brydson, Rik

Aberration-Corrected Analytical Transmission Electron Microscopy

$70.95
Aberration-Corrected Analytical Transmission Electron Microscopy by Brydson, Rik

Aberration-Corrected Analytical Transmission Electron Microscopy

$70.95
Format: Hardcover
Description
Description
x
The book is concerned with the theory, background, and practical use of transmission electron microscopes with lens correctors that can correct the effects of spherical aberration. The book also covers a comparison with aberration correction in the TEM and applications of analytical aberration corrected STEM in materials science and biology. This book is essential for microscopists involved in nanoscale and materials microanalysis especially those using scanning transmission electron microscopy, and related analytical techniques such as electron diffraction x-ray spectrometry (EDXS) and electron energy loss spectroscopy (EELS).

Author: Rik Brydson
ISBN-10: 0470518510
ISBN-13: 9780470518519
Publisher: Wiley
Language: English
Published: 09/26/2011
Pages: 304
Format: Hardcover
Weight: 1.25lbs
Size: 9.10h x 6.20w x 0.80d
By Rik Brydson
By Rik Brydson
x
Professor R.M.D. (Rik) Brydson is based in the School of Process, Environmental and Materials Engineering at the University of Leeds, UK. He is a committee member for the European Microscopy Society as well as the Electron Microscopy and Analysis Group (Institute of Physics).

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