Accelerated Testing: Statistical Models, Test Plans, and Data Analysis by Nelson, Wayne B.

Accelerated Testing: Statistical Models, Test Plans, and Data Analysis (Paperback) (ISBN-13: 9780471697367)

Vendor: Wayne B. Nelson
Product type: Books
Format: Paperback
$169.95
$169.95
$169.95
Subtotal: $169.95
Accelerated Testing: Statistical Models, Test Plans, and Data Analysis by Nelson, Wayne B.

Accelerated Testing: Statistical Models, Test Plans, and Data Analysis

$169.95
Accelerated Testing: Statistical Models, Test Plans, and Data Analysis by Nelson, Wayne B.

Accelerated Testing: Statistical Models, Test Plans, and Data Analysis

$169.95
Format: Paperback
Description
Description
x

Author: Wayne B. Nelson
ISBN-10: 0471697362
ISBN-13: 9780471697367
Publisher: Wiley-Interscience
Language: English
Published: 12/01/2007
Pages: 624
Format: Paperback
Weight: 1.81lbs
Size: 8.93h x 6.38w x 1.16d
By Wayne B. Nelson
By Wayne B. Nelson
x
WAYNE B. NELSON, PhD, is a leading expert on analysis of reliability and accelerated test data. Formerly with General Electric Research & Development for twenty-three years, he now privately consults on and teaches engineering applications of statistics for many companies, professional societies, and universities. For his outstanding contributions to reliability data analysis and accelerated testing, he was elected a Fellow of the Institute of Electrical and Electronics Engineers, the American Society for Quality, and the American Statistical Association.

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