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Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions (Paperback) (ISBN-13: 9781032375113)
Vendor:
Ch Sateesh Kumar
Product type:
Books
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Description
xThe book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.
Author: Ch Sateesh Kumar,M. Muralidhar Singh,Ram Krishna
ISBN-10: 1032375116
ISBN-13: 9781032375113
Publisher: CRC Press
Language: English
Published: 11/29/2024
Pages: 130
Format: Paperback
Weight: 0.47lbs
Size: 9.21h x 6.14w x 0.31d
Author: Ch Sateesh Kumar,M. Muralidhar Singh,Ram Krishna
ISBN-10: 1032375116
ISBN-13: 9781032375113
Publisher: CRC Press
Language: English
Published: 11/29/2024
Pages: 130
Format: Paperback
Weight: 0.47lbs
Size: 9.21h x 6.14w x 0.31d
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