Advances in Imaging and Electron Physics: Silicon-Based Millimetre-Wave Technology Volume 174 by Deen, Jamal

Advances in Imaging and Electron Physics: Silicon-Based Millimetre-Wave Technology Volume 174 (Hardcover) (ISBN-13: 9780123942982)

Vendor: Jamal Deen
Product type: Books
Format: Hardcover
$245.00
$245.00
$245.00
Subtotal: $245.00
Advances in Imaging and Electron Physics: Silicon-Based Millimetre-Wave Technology Volume 174 by Deen, Jamal

Advances in Imaging and Electron Physics: Silicon-Based Millimetre-Wave Technology Volume 174

$245.00
Advances in Imaging and Electron Physics: Silicon-Based Millimetre-Wave Technology Volume 174 by Deen, Jamal

Advances in Imaging and Electron Physics: Silicon-Based Millimetre-Wave Technology Volume 174

$245.00
Format: Hardcover
Description
Description
x
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Author: Jamal Deen
ISBN-10: 0123942985
ISBN-13: 9780123942982
Publisher: Academic Press
Language: English
Published: 11/27/2012
Pages: 484
Format: Hardcover

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