Advances in Optics of Charged Particle Analyzers: Part 1: Volume 232 (Hardcover) (ISBN-13: 9780443297861)

Advances in Optics of Charged Particle Analyzers: Part 1, Volume 232 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Specific chapters cover Introduction to inverse problems in electron microscopy, Directional sinogram inpainting for limited angle tomography, Strain tomography of crystals, FISTA with adaptive discretization, Total variation discretization, and Reconstruction with a Gaussian Dictionary.

Author: Peter W. Hawkes
ISBN-10: 044329786X
ISBN-13: 9780443297861
Publisher: Academic Press
Language: English
Published: 11/27/2024
Pages: 232
Format: Hardcover
Weight: 1.06lbs
Size: 9.00h x 6.00w x 0.56d