Angle-Resolved Photoemission Spectroscopy on High-Temperature Superconductors: Studies of Bi2212 and Single-Layer Fese Film Grown on Srtio3 Substrate by He, Junfeng

Angle-Resolved Photoemission Spectroscopy on High-Temperature Superconductors: Studies of Bi2212 and Single-Layer Fese Film Grown on Srtio3 Substrate (Paperback) (ISBN-13: 9783662570760)

Vendor: Junfeng He
Product type: Books
Format: Paperback
$109.99
$109.99
$109.99
Subtotal: $109.99
Angle-Resolved Photoemission Spectroscopy on High-Temperature Superconductors: Studies of Bi2212 and Single-Layer Fese Film Grown on Srtio3 Substrate by He, Junfeng

Angle-Resolved Photoemission Spectroscopy on High-Temperature Superconductors: Studies of Bi2212 and Single-Layer Fese Film Grown on Srtio3 Substrate

$109.99
Angle-Resolved Photoemission Spectroscopy on High-Temperature Superconductors: Studies of Bi2212 and Single-Layer Fese Film Grown on Srtio3 Substrate by He, Junfeng

Angle-Resolved Photoemission Spectroscopy on High-Temperature Superconductors: Studies of Bi2212 and Single-Layer Fese Film Grown on Srtio3 Substrate

$109.99
Format: Paperback
Description
Description
x
This book mainly focuses on the study of the high-temperature superconductor Bi2Sr2CaCu2O8+δ (Bi2212) and single-layer FeSe film grown on SrTiO3 (STO) substrate by means of angle-resolved photoemission spectroscopy (ARPES). It provides the first electronic evidence for the origin of the anomalous high-temperature superconductivity in single-layer FeSe grown on SrTiO3 substrate. Two coexisted sharp-mode couplings have been identified in superconducting Bi2212. The first ARPES study on single-layer FeSe/STO films has provided key insights into the electronic origin of superconductivity in this system. A phase diagram and electronic indication of high Tc and insulator to superconductor crossover have been established in the single-layer FeSe/STO films. Readers will find essential information on the techniques used and interesting physical phenomena observed by ARPES.


Author: Junfeng He
ISBN-10: 3662570769
ISBN-13: 9783662570760
Publisher: Springer
Language: English
Published: 06/07/2018
Pages: 126
Format: Paperback
Weight: 0.47lbs
Size: 9.21h x 6.14w x 0.31d
By Junfeng He
By Junfeng He
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Junfeng He received his B.Sc. in physics from Sichuan University, China in 2008. He obtained his Ph.D. in condensed matter physics from the Institute of Physics, Chinese Academy of Sciences in July 2013. His PhD thesis was nominated as the "Most Outstanding PH.D Thesis" in 2014 by the Chinese Academy of Sciences. His major research project in Professor Xingjiang Zhou's group was investigation of the electronic structures of advanced materials via Angle Resolved Photoemission Spectroscopy (ARPES). Subsequently, he became a Postdoctoral Fellow working with Prof. Ruihua He at Boston College (September 2013-September 2015) and with Professor Z-X Shen in Stanford from October 2015. Dr. He has published 25 articles in reputed journals, including two Nature Materials, three Nature Communications, one PNAS (Proceedings of the National Academy of Sciences) and one PRL (Physical Review Letters) article as the first/co-first author.

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