Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties by Dahoo, Pierre-Richard

Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties (Hardcover) (ISBN-13: 9781786306401)

Vendor: Pierre-Richard Dahoo
Product type: Books
Format: Hardcover
$177.95
$177.95
$177.95
Subtotal: $177.95
Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties by Dahoo, Pierre-Richard

Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties

$177.95
Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties by Dahoo, Pierre-Richard

Applications and Metrology at Nanometer Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties

$177.95
Format: Hardcover
Description
Description
x
To develop innovations in quantum engineering and nanosystems, designers need to adopt the expertise that has been developed in research laboratories. This requires a thorough understanding of the experimental measurement techniques and theoretical models, based on the principles of quantum mechanics.

This book presents experimental methods enabling the development and characterization of materials at the nanometer scale, based on practical engineering cases, such as 5G and the interference of polarized light when applied for electromagnetic waves. Using the example of electromechanical, multi-physical coupling in piezoelectric systems, smart materials technology is discussed, with an emphasis on scale reduction and mechanical engineering applications.

Statistical analysis methods are presented in terms of their usefulness in systems engineering for experimentation, characterization or design, since safety factors and the most advanced reliability calculation techniques are included from the outset. This book provides valuable support for teachers and researchers but is also intended for engineering students, working engineers and Master�s students.

Author: Pierre-Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami
ISBN-10: 1786306409
ISBN-13: 9781786306401
Publisher: Wiley-Iste
Language: English
Published: 03/16/2021
Pages: 256
Format: Hardcover
Weight: 1.16lbs
Size: 9.21h x 6.14w x 0.63d

By Pierre-Richard Dahoo
By Pierre-Richard Dahoo
x

Pierre Richard Dahoo is Professor and Holder of the Chair of Materials Simulation and Engineering at the University of Versailles Saint-Quentin in France. He is Director of Institut des Sciences et Techniques des Yvelines and a specialist in modeling and spectroscopy at the LATMOS laboratory of the CNRS.

Philippe Pougnet is a former expert in reliability and the technologyproduct-process of embedded mechatronic systems. He graduated from Université Grenoble Alpes and Grenoble INP in France.

Abdelkhalak El Hami is Professor at the Institut National des Sciences Appliquées (INSA-Rouen Normandie) in France and is in charge of the Normandy Conservatoire National des Arts et Metiers (CNAM) Chair of Mechanics, as well as several European pedagogical projects.

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