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Applied Measurement with jMetrik (Hardcover) (ISBN-13: 9780415531955)
Vendor:
J. Patrick Meyer
Product type:
Books
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Description
xApplied Measurement with jMetrik reviews psychometric theory and describes how to use jMetrik to conduct a comprehensive psychometric analysis.
Author: J. Patrick Meyer
ISBN-10: 0415531950
ISBN-13: 9780415531955
Publisher: Routledge
Language: English
Published: 06/30/2014
Pages: 170
Format: Hardcover
Weight: 0.95lbs
Size: 9.20h x 6.10w x 0.60d
By J. Patrick Meyer
xJ. Patrick Meyer is an associate professor in the Curry School of Education at the University of Virginia
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