Aquifer Test Modeling (Hardcover) (ISBN-13: 9781420042924)

In recognition of the trend toward using numerical methdos for analyzing aquifer test data, Aquifer Test Modeling delineates the application of numerical Laplace inversion analytical equations and numerical models and demonstrates the use of public domain software. Written by a leading expert with over fifty years of experience, this highly practical text provides a thorough grounding in the terms and methods employed in aquifer test modeling, while also establishing a protocol for organizing and simplifying conceptual model definition and data analysis. Using graphs, tables, and sample datasets to enhance understanding, the author delineates the five major steps involved in the aquifer test modeling process. He discusses the importance of the conceptual model definition as a framework for organizing, simplifying, and idealizing information. The chapters cover the selection of appropriate aquifer test mathematical model equations compatible with previously defined conceptual models and highlight the importance of reviewing the mathematical assumption and the adjustment of data for any departures. They also explain format selection, technique selection, well function or drawdown calculation, and calibration. The book provides five sample data sets to assist the reader in becoming familiar with WTAQ and MODFLOW aquifer test modeling input and output data file contents with confined nonleaky and unconfined aquifer conditions. It includes conceptual models consisting of abbreviated descriptions of aquifer test facilities, aquifer test data, and aquifer parameter values together with selected sample file sets. These are just a few of the features that make the book a valuable tool for estimating the supply and contamination characteristics of aquifers.

Author: William C. Walton
ISBN-10: 1420042920
ISBN-13: 9781420042924
Publisher: CRC Press
Language: English
Published: 11/01/2006
Pages: 236
Format: Hardcover
Weight: 0.97lbs
Size: 9.11h x 6.46w x 0.70d

Review Citation(s):
Scitech Book News 03/01/2007 pg. 4