Before you leave...
Take 20% off your first order
20% off
Enter the code below at checkout to get 20% off your first order
Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications (Hardcover) (ISBN-13: 9780470638828)
Vendor:
Greg Haugstad
Product type:
Books
- $169.95
$169.95- $169.95
- Unit price
- per
Subtotal:
$169.95
Description
xThis book enlightens readers on the basic surface properties and distance-dependent intersurface forces one must understand to obtain even simple data from an atomic force microscope (AFM). The material becomes progressively more complex throughout the book, explaining details of calibration, physical origin of artifacts, and signal/noise limitations. Coverage spans imaging, materials property characterization, in-liquid interfacial analysis, tribology, and electromagnetic interactions.
Author: Greg Haugstad
ISBN-10: 0470638826
ISBN-13: 9780470638828
Publisher: Wiley
Language: English
Published: 09/24/2012
Pages: 496
Format: Hardcover
Weight: 1.75lbs
Size: 9.30h x 6.20w x 1.20d
"Supplementary material for this book can be found by entering ISBN 9780470638828 on booksupport.wiley.com"
Author: Greg Haugstad
ISBN-10: 0470638826
ISBN-13: 9780470638828
Publisher: Wiley
Language: English
Published: 09/24/2012
Pages: 496
Format: Hardcover
Weight: 1.75lbs
Size: 9.30h x 6.20w x 1.20d
By Greg Haugstad
xGREG HAUGSTAD, PhD, is a technical staff member and Director of the Characterization Facility in the College of Science and Engineering at the University of Minnesota. He has collaborated with industry professionals on such technologies as medical X-ray imaging media, lubrication, inkjet printing, and more recently on biomedical device coatings. He teaches undergraduate and graduate AFM courses, as well as short professional courses, and has trained over 600 AFM users.
Recently Viewed Products
- Choosing a selection results in a full page refresh.