Atomic Force Microscopy: Imaging, Measuring and Manipulating Surfaces at the Atomic Scale (Hardcover) (ISBN-13: 9789535104148)

With the advent of the atomic force microscope (AFM) came an extremely valuable analytical resource and technique useful for the qualitative and quantitative surface analysis with sub-nanometer resolution. In addition, samples studied with an AFM do not require any special pretreatments that may alter or damage the sample and permits a three dimensional investigation of the surface. This book presents a collection of current research from scientists throughout the world that employ atomic force microscopy in their investigations. The technique has become widely accepted and used in obtaining valuable data in a wide variety of fields. It is impressive to see how, in a short time period since its development in 1986, it has proliferated and found many uses throughout manufacturing, research and development.

Author: Victor Bellitto
ISBN-10: 9535104144
ISBN-13: 9789535104148
Publisher: Intechopen
Language: English
Published: 03/23/2012
Pages: 272
Format: Hardcover
Weight: 1.40lbs
Size: 9.61h x 6.69w x 0.63d