Auger Electron Spectroscopy: Practical Application to Materials Analysis and Characterization of Surfaces, Interfaces, and Thin Films by Wolstenholme, John

Auger Electron Spectroscopy: Practical Application to Materials Analysis and Characterization of Surfaces, Interfaces, and Thin Films (Paperback) (ISBN-13: 9781606506813)

Vendor: John Wolstenholme
Product type: Books
Format: Paperback
$79.95
$79.95
$79.95
Subtotal: $79.95
Auger Electron Spectroscopy: Practical Application to Materials Analysis and Characterization of Surfaces, Interfaces, and Thin Films by Wolstenholme, John

Auger Electron Spectroscopy: Practical Application to Materials Analysis and Characterization of Surfaces, Interfaces, and Thin Films

$79.95
Auger Electron Spectroscopy: Practical Application to Materials Analysis and Characterization of Surfaces, Interfaces, and Thin Films by Wolstenholme, John

Auger Electron Spectroscopy: Practical Application to Materials Analysis and Characterization of Surfaces, Interfaces, and Thin Films

$79.95
Format: Paperback
Description
Description
x
This book discusses the use of AES and SAM for the characterization of a wide range of technological materials. These include metals and alloys, semiconductors, nanostructures, and insulators. Its value as a tool for high-resolution elemental imaging and compositional depth profiling is illustrated. The application of the technique for obtaining compositional information from the surfaces, interfaces, and thin film structures of technological and engineering materials is demonstrated. This volume also describes the basic physical principles of AES in simple, largely qualitative, terms understandable by any undergraduate science or engineering student. Major components of typical Auger spectrometers are also described because an understanding of the instrumentation is important to anyone wishing to become a skilled analyst. Mention is also made of other types of analysis for which an Auger electron spectrometer may be used, for example, secondary electron microscopy, backscattered electron imaging, X-ray spectroscopy. The relationship between AES and other analysis techniques is also discussed.

Author: John Wolstenholme
ISBN-10: 1606506811
ISBN-13: 9781606506813
Publisher: Momentum Press
Language: English
Published: 07/28/2015
Pages: 180
Format: Paperback
Weight: 0.76lbs
Size: 9.00h x 6.00w x 0.54d
By John Wolstenholme
By John Wolstenholme
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John Wolstenholme BA, PhD, MRSC, has been involved in surface analytical techniques for most of his professional life and has developed a worldwide reputation in the field of surface analytical instrumentation. After graduating in chemistry from the University of Oxford, he went on to receive a PhD from the University of Manchester, UK. He was employed by Johnson Matthey at the company's research center, working on projects involving catalysts, pigments, and surfaces of biological interest. Later, he was employed by VG Scientific, which subsequently became Thermo Fisher Scientific. Wolstenholme has published many scientific papers and coauthored a book on electron spectroscopy. He retired from full-time employment in May 2013.

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