Bayesian Methods for Data Analysis by Carlin, Bradley P.

Bayesian Methods for Data Analysis (Hardcover) (ISBN-13: 9781584886976)

Vendor: Bradley P. Carlin
Product type: Books
Format: Hardcover
$110.00
$110.00
$110.00
Subtotal: $110.00
Bayesian Methods for Data Analysis by Carlin, Bradley P.

Bayesian Methods for Data Analysis

$110.00
Bayesian Methods for Data Analysis by Carlin, Bradley P.

Bayesian Methods for Data Analysis

$110.00
Format: Hardcover
Description
Description
x

Broadening its scope to nonstatisticians, Bayesian Methods for Data Analysis, Third Edition provides an accessible introduction to the foundations and applications of Bayesian analysis. Along with a complete reorganization of the material, this edition concentrates more on hierarchical Bayesian modeling as implemented via Markov chain Monte Carlo (MCMC) methods and related data analytic techniques.

New to the Third Edition

  • New data examples, corresponding R and WinBUGS code, and homework problems
  • Explicit descriptions and illustrations of hierarchical modeling--now commonplace in Bayesian data analysis
  • A new chapter on Bayesian design that emphasizes Bayesian clinical trials
  • A completely revised and expanded section on ranking and histogram estimation
  • A new case study on infectious disease modeling and the 1918 flu epidemic
  • A solutions manual for qualifying instructors that contains solutions, computer code, and associated output for every homework problem--available both electronically and in print

    • Ideal for Anyone Performing Statistical Analyses

    Focusing on applications from biostatistics, epidemiology, and medicine, this text builds on the popularity of its predecessors by making it suitable for even more practitioners and students.



    Author: Bradley P. Carlin,Thomas A. Louis
    ISBN-10: 1584886978
    ISBN-13: 9781584886976
    Publisher: CRC Press
    Language: English
    Published: 06/01/2008
    Pages: 552
    Format: Hardcover
    Weight: 2.00lbs
    Size: 9.30h x 6.10w x 1.30d

    Review Citation(s):
    Scitech Book News 12/01/2008 pg. 38

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