Controlled Atmosphere Transmission Electron Microscopy: Principles and Practice (Hardcover) (ISBN-13: 9783319229874)

Thomas Hansen was born in Helsing, Denmark andreceived his masters from the University of Copenhagen. He worked as a research scientist at Haldor Tops A/S, where he continued his PhD studies in collaboration with the University of New Mexico and the Technical University of Denmark. After serving as a post-doctoral fellow at the Fritz Haber Institute in Berlin, Dr. Hansen returned to Denmark as a researcher at the Center for Electron Nanoscopy at the Technical University and continues there as a senior researcher. He is responsible for the department's aberration corrected environmental transmission electron microscope and teaches a course on the use of electron microscopy for materials research along with guest lecturing in several other courses and international workshops.

Dr. Hansen has published more than 70 peer-reviewed papers on characterization using electron microscopy and has organized several symposia at international conferences with in situ microscopy as themain theme.

Jakob B. Wagner was born in Odense, Denmark in 1974. He received his Master of Science in Physics degree at the University of Southern Denmark, Odense in 1999. In 2002, after completing his PhD studies at University of Copenhagen in collaboration with Haldor Tops A/S, Dr. Wagner served as a post doctoral fellow first at

the Fritz Haber Institute in Berlin, Germany, then at Lund University, Sweden. In 2007, Dr. Wagner became a senior researcher at the newly started Center for Electron Nanoscopy at the Technical University of Denmark, where he became Scientific Director and Professor in 2013. He is responsible for the overall scientific use of the electron microscopy facility along with teaching and lecturing at various courses and workshops in advanced electron microscopy.

Dr. Wagner has published over 90 papers where electron microscopy has been a major tool for characterization and has organized several symposia at international conferences with insitu microscopy as the main theme