Cryo-Electron Tomography: A Journey from Sample Preparation to Data Mining (Paperback) (ISBN-13: 9780443188299)

Cryo-electron Tomography: A Journey from Sample Preparation to Data Mining offers a comprehensive guide to the latest state-of-the-art methods and techniques available to researchers. The book begins with a section on sample preparation, considering a range of different sample types including virus-like particles, viruses, bacteria, organoids and tissues, with some chapters dedicated to specific tools like in situ cellular tomography and correlative techniques. The book then moves on to a section on data mining and specific steps and methods, delivering a complete overview of this advancing technique and providing researchers with the knowledge and tools required for their own investigations.

Author: Dorit Hanein
ISBN-10: 0443188297
ISBN-13: 9780443188299
Publisher: Academic Press
Language: English
Published: 12/01/2024
Pages: 360
Format: Paperback