Defects in Boron Ion Implanted Silicon by Office of Scientific &. Technical Inform

Defects in Boron Ion Implanted Silicon (Paperback) (ISBN-13: 9781288823055)

Vendor: Office of Scientific &. Technical Inform
Product type: Books
Format: Paperback
$57.95
$57.95
$57.95
Subtotal: $57.95
Defects in Boron Ion Implanted Silicon by Office of Scientific &. Technical Inform

Defects in Boron Ion Implanted Silicon

$57.95
Defects in Boron Ion Implanted Silicon by Office of Scientific &. Technical Inform

Defects in Boron Ion Implanted Silicon

$57.95
Format: Paperback
Description
Description
x

The Office of Scientific & Technical Information (OSTI), is a part of the U.S. Department of Energy (DOE) that houses research and development results from projects funded by the DOE. The information is generally an article, technical document, conference paper or dissertation. This is one of those publications.


Author: Office of Scientific &. Technical Inform,W. K. Wu
ISBN-10: 1288823053
ISBN-13: 9781288823055
Publisher: Biblioscholar
Language: English
Published: 02/28/2013
Pages: 120
Format: Paperback
Weight: 0.50lbs
Size: 9.69h x 7.44w x 0.25d

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