Design and Test Technology for Dependable Systems-on-Chip by Ubar, Raimund

Design and Test Technology for Dependable Systems-on-Chip (Hardcover) (ISBN-13: 9781609602123)

Vendor: Raimund Ubar
Product type: Books
Format: Hardcover
$180.00
$180.00
$180.00
Subtotal: $180.00
Design and Test Technology for Dependable Systems-on-Chip by Ubar, Raimund

Design and Test Technology for Dependable Systems-on-Chip

$180.00
Design and Test Technology for Dependable Systems-on-Chip by Ubar, Raimund

Design and Test Technology for Dependable Systems-on-Chip

$180.00
Format: Hardcover
Description
Description
x
Designing reliable and dependable embedded systems has become increasingly important as the failure of these systems in an automotive, aerospace or nuclear application can have serious consequences. Design and Test Technology for Dependable Systems-on-Chip covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC). This book provides insight into refined "classical" design and test topics and solutions for IC test technology and fault-tolerant systems.

Author: Raimund Ubar
ISBN-10: 1609602129
ISBN-13: 9781609602123
Publisher: Information Science Reference
Language: English
Published: 03/31/2011
Pages: 580
Format: Hardcover
Weight: 3.55lbs
Size: 11.20h x 8.60w x 1.40d

Review Citation(s):
Reference and Research Bk News 06/01/2011 pg. 307

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