Diagnostic Measurements in Lsi/VLSI Integrated Circuits Production (Hardcover) (ISBN-13: 9789810202828)

This book describes means in improving the technology of LSI/VLSI ICs production. It does so by concentrating on improvements of manufacturing yield and quality of the products by detecting weak points which should be eliminated on the way up the learning curve. The book presents a systematic approach to the problem, covering primarily methods based on the use of test patterns measurements, in both mass production and in research and development activities. The main groups of defects found in IC chips and ways to detect them using test structures are discussed in detail.

Author: Andrzej Jakubowski,Wieslaw Marciniak,Henryk M. Przewlocki
ISBN-10: 9810202822
ISBN-13: 9789810202828
Publisher: World Scientific Publishing Company
Language: English
Published: 04/01/1991
Pages: 372
Format: Hardcover
Weight: 1.38lbs
Size: 8.82h x 6.34w x 0.97d