Digital Integrated Circuit Testing from a Quality Perspective (Hardcover) (ISBN-13: 9780442006433)

Applies the methods of modern quality to the testing of digital integrated circuits. Explains new paradigms and techniques ranging from SSI to high-level VLSI, and how to match testing methods to the design and physical layout of the device. Accounts for the change in the electronics industry from a

Author: Eugene R. Hnatek
ISBN-10: 0442006438
ISBN-13: 9780442006433
Publisher: Springer
Language: English
Published: 08/31/1993
Pages: 180
Format: Hardcover
Weight: 1.05lbs
Size: 9.72h x 6.24w x 0.65d