Digital Noise Monitoring of Defect Origin (Hardcover) (ISBN-13: 9780387717531)

Book is intended for teachers, post-graduate students, and university students of all professions except the humanities. It deals with signals and noises at the output of sensors for both technical and biological objects at the origin of a defect.

Author: Telman Aliev
ISBN-10: 0387717536
ISBN-13: 9780387717531
Publisher: Springer
Language: English
Published: 07/25/2007
Pages: 224
Format: Hardcover
Weight: 1.12lbs
Size: 9.21h x 6.14w x 0.56d