Electric Machines: Modeling, Condition Monitoring, and Fault Diagnosis by Toliyat, Hamid A.

Electric Machines: Modeling, Condition Monitoring, and Fault Diagnosis (Paperback) (ISBN-13: 9781138073975)

Vendor: Hamid A. Toliyat
Product type: Books
Format: Paperback
$115.99
$115.99
$115.99
Subtotal: $115.99
Electric Machines: Modeling, Condition Monitoring, and Fault Diagnosis by Toliyat, Hamid A.

Electric Machines: Modeling, Condition Monitoring, and Fault Diagnosis

$115.99
Electric Machines: Modeling, Condition Monitoring, and Fault Diagnosis by Toliyat, Hamid A.

Electric Machines: Modeling, Condition Monitoring, and Fault Diagnosis

$115.99
Format: Paperback
Description
Description
x

In response to the multidisciplinary nature of fault diagnosis and condition monitoring, this text describes different types of faults in electric machines and the techniques employed in their detection. Representing an advance in the condition monitoring and diagnostics literature, this book concentrates on state-of-the-art noninvasive methods that can be utilized on running machines without interfering with their processes. The authors also explain how the availability of inexpensive yet powerful processing powers using digital signal processors makes it possible to seamlessly integrate the task of condition monitoring and fault diagnosis with machine control algorithms.



Author: Hamid A. Toliyat,Subhasis Nandi,Seungdeog Choi
ISBN-10: 1138073970
ISBN-13: 9781138073975
Publisher: CRC Press
Language: English
Published: 03/29/2017
Pages: 272
Format: Paperback
Weight: 0.85lbs
Size: 9.21h x 6.14w x 0.57d
By Hamid A. Toliyat
By Hamid A. Toliyat
x

Prof. Toliyat is currently a Raytheon Company endowed professor of electrical and computer engineering at Texas A&M University. He has received several awards, including the prestigious Cyrill Veinott Award in Electromechanical Energy Conversion from the IEEE Power Engineering Society (2004), the Patent and Innovation Award from Texas A&M University System Office of Technology Commercialization (2007), the TEES Faculty Fellow Award (2006), the Texas A&M Select Young Investigator Award (1999), and the Space Act Award from NASA (1999). He has also received four prize paper awards from the IEEE. Prof. Toliyat has published more than 370 technical papers (including more than 110 in IEEE Transactions) and has 12 issued and pending U.S. patents.

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