Electromigration (Paperback) (ISBN-13: 9783639088137)

Electromigration is a microscopic phenomenon involving electric field-induced diffusion, which is very relevant to damage in interconnections. A common method for monitoring interconnection degradation is through electrical resistance measurements, which requires direct electrical contact. It is desirable to develop non-contact methods to monitor electromigration damage formation. In this thesis, we propose a novel Optical Microscopy Imaging Method (OMIM), and we provide a theoretical description and experimental results. OMIM not only pro-vides a new method for studying electromigration, but also provides a useful method for studying other micro-devices and materials in a non-contact mode.

Author: Linghong Li
ISBN-10: 3639088131
ISBN-13: 9783639088137
Publisher: VDM Verlag Dr. Mueller E.K.
Language: English
Published: 10/10/2008
Pages: 76
Format: Paperback
Weight: 0.25lbs
Size: 9.00h x 6.00w x 0.16d