Electron Microprobe Analysis and Scanning Electron Microscopy in Geology (Hardcover) (ISBN-13: 9780521848756)

Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint. Topics discussed include: principles of electron-target interactions, electron beam instrumentation, X-ray spectrometry, general principles of SEM image formation, production of X-ray 'maps' showing elemental distributions, procedures for qualitative and quantitative X-ray analysis (both energy-dispersive and wavelength-dispersive), the use of both 'true' electron microprobes and SEMs fitted with X-ray spectrometers, and practical matters such as sample preparation and treatment of results. Throughout, there is an emphasis on geological aspects not mentioned in similar books aimed at a more general readership. The book avoids unnecessary technical detail in order to be easily accessible, and forms a comprehensive text on EMPA and SEM for geological postgraduate and postdoctoral researchers, as well as those working in industrial laboratories.

Author: S. J. B. Reed
ISBN-10: 052184875X
ISBN-13: 9780521848756
Publisher: Cambridge University Press
Language: English
Published: 08/25/2005
Pages: 232
Format: Hardcover
Weight: 1.28lbs
Size: 9.78h x 7.10w x 0.62d