Electron Microscopy Studies of Ion Implanted Silicon by Office of Scientific &. Technical Inform

Electron Microscopy Studies of Ion Implanted Silicon (Paperback) (ISBN-13: 9781288822416)

Vendor: Office of Scientific &. Technical Inform
Product type: Books
Format: Paperback
$57.95
$57.95
$57.95
Subtotal: $57.95
Electron Microscopy Studies of Ion Implanted Silicon by Office of Scientific &. Technical Inform

Electron Microscopy Studies of Ion Implanted Silicon

$57.95
Electron Microscopy Studies of Ion Implanted Silicon by Office of Scientific &. Technical Inform

Electron Microscopy Studies of Ion Implanted Silicon

$57.95
Format: Paperback
Description
Description
x

The Office of Scientific & Technical Information (OSTI), is a part of the U.S. Department of Energy (DOE) that houses research and development results from projects funded by the DOE. The information is generally an article, technical document, conference paper or dissertation. This is one of those publications.


Author: Office of Scientific &. Technical Inform,K. Seshan
ISBN-10: 1288822413
ISBN-13: 9781288822416
Publisher: Biblioscholar
Language: English
Published: 02/28/2013
Pages: 110
Format: Paperback
Weight: 0.47lbs
Size: 9.69h x 7.44w x 0.23d

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