Ellipsometry at the Nanoscale (Paperback) (ISBN-13: 9783662519714)

Preamble.- Preface.- A Brief History and State of the Art of Ellipsometry.-Advanced Mueller Ellipsometry Instrumentation and Data Analysis.- Data Analysis for Nanomaterials: Effective Medium Approximation, its Limits and Implementations.- Relationship between Surface Morphology and Effective Medium Roughness.- Plasmonics and Effective-Medium Theory.- Thin films of Nanostructured Plasmonic Noble Metals.- Spectroscopic Ellipsometry on Metallic Gratings.- Mueller matrix applied to nanostructures.- Spectroscopic Ellipsometry and Magneto-Optical Kerr Spectroscopy of Magnetic Garnet Thin Films Incorporating Plasmonic Nanoparticles.- Generalized Ellipsometry Characterization of Sculptured Thin Films made by Glancing Angle Deposition.- THz Generalized Ellipsometry characterization of highly-ordered 3-dimensional Nanostructures.- Infrared ellipsometric investigations of free carriers and lattice vibrations in superconducting cuprates.- Real-time Ellipsometry for Probing charge-transfer processes at the nanoscale.- Polarimetric and other Optical Probes for the Solid - Liquid Interface.- Spectroscopic Ellipsometry for functional nano-layers of flexible organic electronic devices.- Spectroscopic Ellipsometry of Nanoscale Materials for Semiconductor Device Applications.- Ellipsometry of semiconductor nanocrystals.- Spectroscopic Ellipsometry for Inline Process Control in the Semiconductor Industry.- Thin film applications in research and industry characterized by spectroscopic ellipsometry.- Ellipsometry and Correlation Measurements.- Nanotechnology: Applications and markets, present and future.

Author: Maria Losurdo
ISBN-10: 3662519712
ISBN-13: 9783662519714
Publisher: Springer
Language: English
Published: 08/23/2016
Pages: 730
Format: Paperback
Weight: 2.29lbs
Size: 9.21h x 6.14w x 1.51d