Failure Analysis: High Technology Devices by Sullivan, Daniel J. D.

Failure Analysis: High Technology Devices (Paperback) (ISBN-13: 9781501524783)

Vendor: Daniel J. D. Sullivan
Product type: Books
Format: Paperback
$86.99
$86.99
$86.99
Subtotal: $86.99
Failure Analysis: High Technology Devices by Sullivan, Daniel J. D.

Failure Analysis: High Technology Devices

$86.99
Failure Analysis: High Technology Devices by Sullivan, Daniel J. D.

Failure Analysis: High Technology Devices

$86.99
Format: Paperback
Description
Description
x

The book presents a unique view of failure analysis of high technology devices. It describes capabilities and limitations of many analytical techniques and testing paths and decisions best followed in example failure analysis studies.



Author: Daniel J. D. Sullivan, Eric J. Carleton
ISBN-10: 150152478X
ISBN-13: 9781501524783
Publisher: de Gruyter
Language: English
Published: 10/24/2022
Pages: 128
Format: Paperback
Weight: 0.48lbs
Size: 9.61h x 6.69w x 0.28d
By Daniel J. D. Sullivan
By Daniel J. D. Sullivan
x

Dr. Daniel J. D. Sullivan

attended Cal & U. C. San Diego. Managed: FA, Reliability and Materials labs. Currently in sales and marketing at EAG labs. He has also written a non-technical book, "Don't Date Crazy" by DJDS, and published a board game called Infection.

Dr. Eric J. Carleton

is a technology developer and consultant who has incubated multiple technology startups, founded Arrhenius, a failure analysis firm, and serves clients in a wide array of industries on scientific analysis and litigation matters.

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