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High-Pressure Rheology for Quantitative Elastohydrodynamics, Second Edition, contains updated sections on scaling laws and thermal effects, including new sections on the importance of the pressure dependence of viscosity, the role of the localization limit of stress, and new material on the shear dependence of viscosity and temperature dependence viscosity. Since publication of the original edition, the experimental methods, the resulting property data and new correlations have resulted in a revolution in understanding of the mechanisms of film formation and the mechanical dissipation.
Author: Scott S. Bair
ISBN-10: 0444641564
ISBN-13: 9780444641564
Publisher: Elsevier
Language: English
Published: 04/19/2019
Pages: 388
Format: Paperback
Weight: 1.14lbs
Size: 9.00h x 6.00w x 0.80d
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