High Resolution X-Ray Diffractometry And Topography (Paperback) (ISBN-13: 9780367400637)

The rapid growth in the applications of electronic materials has created an increasing demand for reliable techniques for examining and characterizing these materials. This book explores the area of x-ray diffraction and the techniques available for deployment in research, development, and production. It maps the theoretical and practical background necessary to study single crystal materials using high resolution x-ray diffraction and topography. It combines mathematical formalism with graphical explanations and hands-on advice for interpreting data, thus providing the theoretical and practical background for applying these techniques in scientific and industrial materials characterization.

Author: D. K. Bowen, Brian K. Tanner
ISBN-10: 0367400634
ISBN-13: 9780367400637
Publisher: CRC Press
Language: English
Published: 10/10/2019
Pages: 264
Format: Paperback
Weight: 0.95lbs
Size: 9.50h x 6.80w x 0.70d