Hot-Carrier Effects in Mos Devices (Hardcover) (ISBN-13: 9780126822403)

The exploding number of uses for ultrafast, ultrasmall integrated circuits has increased the importance of hot-carrier effects in manufacturing as well as for other technological applications. They are rapidly movingout of the research lab and into the real world.

This book is derived from Dr. Takedas book in Japanese, Hot-Carrier Effects, (published in 1987 by Nikkei Business Publishers). However, the new book is much more than a translation. Takedas original work was a starting point for developing this much more complete and fundamental text on this increasingly important topic. The new work encompasses not only all the latest research and discoveries made in the fast-paced area of hot carriers, but also includes the basics of MOS devices, and the practical considerations related to hot carriers.

Author: Eiji Takeda, Cary Y. Yang, Akemi Miura-Hamada
ISBN-10: 0126822409
ISBN-13: 9780126822403
Publisher: Academic Press
Language: English
Published: 11/20/1995
Pages: 312
Format: Hardcover
Weight: 1.34lbs
Size: 9.00h x 6.00w x 0.75d