Infrared Characterization for Microelectronics (Hardcover) (ISBN-13: 9789810223526)

Most of the books on infrared characterization are for applications in chemistry and no book has been dedicated to infrared characterization for microelectronics. The focus of the book will be on practical applications useful to the production line and to the research and development of microelectronics. The background knowledge and significance of doing a particular type of infrared measurement will be discussed in detail. The principal purpose of the book is to serve as a useful handbook for practising engineers and scientists in the field of microelectronics.

Author: Wai Shing Lau
ISBN-10: 9810223528
ISBN-13: 9789810223526
Publisher: World Scientific Publishing Company
Language: English
Published: 10/04/1999
Pages: 172
Format: Hardcover
Weight: 0.79lbs
Size: 8.70h x 6.10w x 0.60d

Review Citation(s):
Scitech Book News 09/01/2000 pg. 137