Infrared Thermal Imaging: Fundamentals, Research and Applications (Hardcover) (ISBN-13: 9783527413515)

Michael Vollmer received his PhD degree for studies of clusters on surfaces, and his habilitation on optical properties of metal clusters from the University of Heidelberg, Germany. Later assignments were with the University of Kassel, Germany, the university of California in Berkeley, USA, as well as with various institutions in the United States and Asia during sabbaticals. His research interests include atmospheric optics, spectroscopy, infrared thermal imaging, and the didactics of physics. Professor Vollmer has authored one science book and co-authored a scientific monograph and about 230 scientific and didactical papers.

Klaus-Peter Mlmann received his PhD from the Humboldt University of Berlin, Germany, studying strongly doped narrow band semiconductors at low temperatures and later, for his habilitation, MCT photo detectors. He subsequently held positions with the Humboldt University and with several businesses in industry. Professor Mlmann's research interests include MEMS technology, infrared thermal imaging, and spectroscopy. He is the co-author of about 150 scientific and didactical papers.
Both authors are professors of experimental physics at the University of Applied Sciences in Brandenburg, Germany.