Introduction to Focused Ion Beam Nanometrology by Cox, David C.

Introduction to Focused Ion Beam Nanometrology (Hardcover) (ISBN-13: 9781643278469)

Vendor: David C. Cox
Product type: Books
Format: Hardcover
$120.00
$120.00
$120.00
Subtotal: $120.00
Introduction to Focused Ion Beam Nanometrology by Cox, David C.

Introduction to Focused Ion Beam Nanometrology

$120.00
Introduction to Focused Ion Beam Nanometrology by Cox, David C.

Introduction to Focused Ion Beam Nanometrology

$120.00
Format: Hardcover
Description
Description
x
This book describes modern focused ion beam microscopes and techniques and how they can be used to aid materials metrology and as tools for the fabrication of devices that in turn are used in many other aspects of fundamental metrology.

Author: David C. Cox
ISBN-10: 1643278460
ISBN-13: 9781643278469
Publisher: Morgan & Claypool
Language: English
Published: 10/01/2015
Pages: 104
Format: Hardcover
Weight: 0.81lbs
Size: 10.00h x 7.00w x 0.25d

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