Introduction to Focused Ion Beam Nanometrology by Cox, David C.

Introduction to Focused Ion Beam Nanometrology (Paperback) (ISBN-13: 9781681740201)

Vendor: David C. Cox
Product type: Books
Format: Paperback
$99.95
$99.95
$99.95
Subtotal: $99.95
Introduction to Focused Ion Beam Nanometrology by Cox, David C.

Introduction to Focused Ion Beam Nanometrology

$99.95
Introduction to Focused Ion Beam Nanometrology by Cox, David C.

Introduction to Focused Ion Beam Nanometrology

$99.95
Format: Paperback
Description
Description
x
This book describes modern focused ion beam microscopes and techniques and how they can be used to aid materials metrology and as tools for the fabrication of devices that in turn are used in many other aspects of fundamental metrology.

Author: David C. Cox
ISBN-10: 1681740206
ISBN-13: 9781681740201
Publisher: Morgan & Claypool
Language: English
Published: 10/01/2015
Pages: 104
Format: Paperback
Weight: 0.36lbs
Size: 10.00h x 7.00w x 0.17d

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