Introduction to Scanning Tunneling Microscopy (Hardcover) (ISBN-13: 9780195071504)

Due to its nondestructive imaging power, scanning tunneling microscopy has found major applications in the fields of physics, chemistry, engineering, and materials science. This book provides a comprehensive treatment of scanning tunneling and atomic force microscopy, with full coverage of the imaging mechanism, instrumentation, and sample applications. The work is the first single-author reference on STM and presents much valuable information previously available only as proceedings or collections of review articles. It contains a 32-page section of remarkable STM images, and is organized as a self-contained work, with all mathematical derivations fully detailed. As a source of background material and current data, the book will be an invaluable resource for all scientists, engineers, and technicians using the imaging abilities of STM and AFM. It may also be used as a textbook in senior-year and graduate level STM courses, and as a supplementary text in surface science, solid-state physics, materials science, microscopy, and quantum mechanics.

Author: C. Julian Chen
ISBN-10: 0195071506
ISBN-13: 9780195071504
Publisher: Oxford University Press, USA
Language: English
Published: 05/20/1993
Pages: 472
Format: Hardcover
Weight: 1.84lbs
Size: 9.21h x 6.14w x 1.00d